X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analysing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, biological materials, pharmaceuticals, thin- film coatings, ceramics, solar cells and semiconductors. XRD is the most wanted tool for industry and research institutes especially for materials investigation, characterisation and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, Molecular structure, crystallite size and strain, structure and relaxation determination, texture and residual stress investigations. The Bruker D8 X-ray diffractometers are designed to easily accommodate all X-ray diffraction applications in material research, powder diffraction and high-resolution diffraction. The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug’n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users. The package from Bruker also involves Topas (Reitveld Refinement software), Eva (Search Matching software), ICDD database and ICSD database. Hence the present XRD and the software make a perfect tool for structural analysis.