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Carl Zeiss EVO 18 Secondary Electron Microscope with EDS

SEM facilitates the observation of very fine details (high resolution) of materials and good focus over a wide range of specimen surface (large depth of field). It also produces clear image of specimen ranging from object visible to the naked eye to a structure spanning few nanometers. Besides its use in studying soils, sedimentary particles, rock materials, synthesized compounds, and biological materials, it also helps to elucidate the architecture and evolution of microfossils. EVO 18 Research is an analytical SEM for academic and research organisations. Profit from excellent quality imaging results with the capability to handle a variety of material types. Coupled with the ease-of-use provided by SmartSEM software, EVO 18 Research is perfectly suited to a variety of research applications including Semiconductor and Electronics, Geoscience,Biological and Materials.The Energy dispersive X-ray analysis attachment (AMETEK EDAX Octane series) is used to carryout semi quantitative elemental analysis of the samples.

System Specification

Filament :Tungsten
Modes : HV , VP
Secondary e-image resolution :50 NM (Depends on sample and Mode)
BSE Detector :Available
EDS Detector :Available
Tilt :0 – 60 Degree
Rotation :360 Degree
EHT :200V – 30KV
Magniication :Up to 50K ~ 100K (Depends on sample)